| How does SEM work?
A focussed beam of electrons is scanned over the surface of a sample. Electrons reflected from that surface are collected by a sensor, amplified and then used to form an image on a screen.
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Our Joel JSM-IC 848A Microskope
The large sample chamber takes samples and components up to 200 diameter and 50mm heigh. The microskope is equipped with a state-of-the-art ADX for chemical analysis. |
Advantages of the method
The principal advantage of the scanning electron microscope is its ability to deliver very high resolution combined with a great depth of focus. Magnification of up to approx. x 50,000 can be achieved. In addition to the exact representation of the surface topography, local differences in sample composition can also be visualised. By using the EDX, elements with atomic mass greater than 6 (including O, C and N) can be qualitatively and semi-quantitatively profiled.
Examples of applications
- Characterisation of materials and surfaces
- Inspection of fracture surfaces and failure analysis
- Quality control of components and assemblies
- Determination of elemental composition (excluding H, Li and Be) onvery small samples
Delivery
SEM investigations can normally be conducted within 1 – 3 working days. Customers are welcome to be present.
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