How an AFM works

In atomic force microscopy, a fine tip attached to the end of a cantilever with an extremely low spring constant, is brought into contact with a surface and scanned gently across it. A laser detects the vertical and lateral position of the tip. This information is used to form a 3-D image of the surface. The data can also be evaluated quantitatively as height profiles, roughness values and area ratios of different phases etc.

Advantages of the method

In addition to providing detailed topographic data, the method allows local differences in materials' properties to be detected and analysed. It is applicable to all types of materials and requires only simple sample preparation.

Our Atomic Force Microskope (AFM)	Characterisation of a composite material in phase contrast mode

Examples of applications

• Characterisation of coatings (Metallic, non-metallic, organic, inorganic)
• Roughness measurements on the nanometre scale
• Tribological studies
• Characterisation of polymers

Characterisation of PVD coatings

The AFM provides access to a variety of information hidden in a surface.

Delivery

AFM investigations can normally be completed within 2 -3 working days.

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